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Now this is more of a collection of papers rather than a book on lead-free technology, but its specific focus is on lead-free material science and ideal for engineers rather than a shop floor reference source. It is more for the person who wants to go past the alloy types and understand the elements and their interactions during the assembly process and the potential joint reliability. All the invited papers where produced for a special issue of the Journal of Materials Science, materials in electronics. Obviously the publisher felt this would make a valued contribution to the wider market place and I have to agree. There is a fair amount of duplication in the text on the whys of lead-free but this does not detract from the final compilation. The main part of the text is devoted to soldering materials with all the most common alloys illustrated and supported with mechanical data and phase diagrams. Researchers from Chemical Engineering Department of Tsing Hua University outline most of the common alloy data gathered from a wide source of papers and reports. They compare the information and highlight differences in the available data. Where possible they have suggested where more investigations are necessary for a better understanding of each material set. Laura Turbini provides a chapter on soldering materials and their possible impact on corrosion at elevated temperatures. Because of her long interest and research work into Conductive Anodic Filament CAF formation this is covered with some good examples of the way in which this form of electrical short can occur. It has been demonstrated in many studies that, where greater stress is put on laminate it is possible for separation of the glass and epoxy bundles to open up a path for CAF formation. However there are some simple design rules, often not used to increase product reliability, which have been reported in other reference sources. Considerable pressure is placed on professional consumer electronics, must be faster, smaller, cheaper and now RoHS compliant. A paper by Darrel Frear of Freescale outline very well the issues faced and the most common or potential failure modes. The text is well illustrated with example of typical joints and solder interface structures. Care is taken to discuss one of the most challenging tests with lead free alloys drop testing. A draft standard from the IPC/JEDEC is available as a second source of information. Other chapters consider tin whiskers, tin pest, electromigration
in lead-free solder joints and the impact of RoHS on high performance
electronics. The paper on high performance products is split into two
sections and authored by Karl Puttlitz and George Galyon and covers some
other interconnection methods which may be impacted by RoHS. Karl was
originally with IBM now working as a consultant after his retirement,
he co-edited other excellent books on lead-free and BGA when he was still
at IBM. |
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